Interconnect Devices is Other Semiconductors in United States that focus on high-reliability connectors business. Founded in 1979. They cover business area such as designer, manufacturer, spring contact probe, testing, circuit board, test socket, test semiconductor device, custom probe, high-performance, high-reliability connector, industry, aerospace, mobile communication, portable electronic.
1979
( 45 years old in 2024 )
High-reliability Connectors
-
5101 Richland Avenue
Kansas City, KS 66106
United States
Private
designermanufacturerspring contact probetestingcircuit boardtest sockettest semiconductor devicecustom probehigh-performance, high-reliability connectorindustryaerospacemobile communicationportable electronic
* We use standard office opening hours in near Interconnect Devices's location as default value for unknown and outdated data. For more valid info, please verify the info from more trusted sources like GoogleMyBusiness, Yelp, FourSquare or similar services.
Interconnect Devices is Other Semiconductors business from United States that founded in 1979 (45 years old in 2024), Interconnect Devices business is focusing on High-reliability Connectors.
Interconnect Devices headquarter office and corporate office address is located in 5101 Richland Avenue Kansas City, KS 66106 United States.
Interconnect Devices was founded in United States.
In 2024, Interconnect Devices is currently focus on high-reliability connectors sector.
Above is snippet of Google Trends for "high-reliability connectors" term, if you have problem loading the snippet, please visit here: Google Trend.
Disclaimer: This website is not affiliated with Interconnect Devices, any government agency, does not create this data, vouch for its accuracy, or guarantee that it is the most recent data available. The data displayed is available through open government websites and public online directory. This website expressly disclaims the accuracy, adequacy, or completeness of any data and shall not be liable for any errors, omissions or other defects in, delays or interruptions in such data, or for any actions taken in reliance thereon.
