Optical Metrology Innovations is Application Specific Semiconductors in Ireland that focus on compound semiconductor technologies business. Founded in 1999. They cover business area such as Provider, diagnostic metrology service, photonic, microsystem, industry, OMISTRAIN, OMIPROBE, customer, packaging, compound semiconductor technology.
Application Specific Semiconductors
1999
( 27 years old in 2026 )
Compound Semiconductor Technologies
-
2200 Cork Airport Business Park
Cork
Ireland
Private
Providerdiagnostic metrology servicephotonicmicrosystemindustryOMISTRAINOMIPROBEcustomerpackagingcompound semiconductor technology
* We use standard office opening hours in near Optical Metrology Innovations's location as default value for unknown and outdated data. For more valid info, please verify the info from more trusted sources like GoogleMyBusiness, Yelp, FourSquare or similar services.
Optical Metrology Innovations is Application Specific Semiconductors business from Ireland that founded in 1999 (27 years old in 2026), Optical Metrology Innovations business is focusing on Compound Semiconductor Technologies.
Optical Metrology Innovations headquarter office and corporate office address is located in 2200 Cork Airport Business Park Cork Ireland.
Optical Metrology Innovations was founded in Ireland.
In 2026, Optical Metrology Innovations is currently focus on compound semiconductor technologies sector.
Above is snippet of Google Trends for "compound semiconductor technologies" term, if you have problem loading the snippet, please visit here: Google Trend.
Disclaimer: This website is not affiliated with Optical Metrology Innovations, any government agency, does not create this data, vouch for its accuracy, or guarantee that it is the most recent data available. The data displayed is available through open government websites and public online directory. This website expressly disclaims the accuracy, adequacy, or completeness of any data and shall not be liable for any errors, omissions or other defects in, delays or interruptions in such data, or for any actions taken in reliance thereon.
